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China Sales and Service Office: Contact: Alan Cao (曹全喜) Tel: +86-131 2475 3246 Email: cquanxi@163.com |
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QEXL Solar Cell Quantum Efficiency / IPCE / Spectral Response Measurement System ♦ 300 nm to 1100 nm scan range (1400 nm range available) ♦ High resolution scan in under 1 minute ♦ Probe beam from 1 mm to 20 mm ♦ Seamless switching between DC and AC measurement modes ♦ 1 Hz to 120 Hz chopping frequency The QEXL Solar Cell Quantum Efficiency / IPCE / Spectral Response Measurement System is a low-cost, high-performance quantum efficiency measurement system, which is capable of delivering high speed measurements on most types of solar cells. The system is designed for fast, high accuracy measurements of dye sensitized, Perovskite, crystalline and amorphous silicon, CdTe, and similar devices. This new design enables us to offer a QE measurement system for a lower price than previously possible while still delivering the same excellent quality and outstanding accuracy. Fast and Repeatable MeasurementsMeasure your cells fast with great repeatability. The graph here shows the results of 5 scans of a single crystalline silicon solar cell. Each scan was performed in 154 seconds. Faster scans can be acheived on many cell types without noticable loss of repeatability.QEXL Features and OptionsThe table below gives an overview of QEXL standard and optional features.denotes a standard feature. denotes an optional feature. Feature, Standard or Optional ♦ Xenon Arc Lamp, Standard Feature ♦ 5 nm spectral bandwidth, Standard Feature ♦ 300 nm – 1100 nm range, Standard Feature ♦ 1100 nm – 1400 nm range extension, Optional ♦ Discrete beam size selection, Standard Feature ♦ 1 mm x 1 mm beam option, Standard Feature ♦ 1 mm x 3 mm beam option, Standard Feature ♦ 1 Hz – 120 Hz chopping frequency, Standard Feature ♦ DC mode for DSSC devices, Optional ♦ 1 white bias light, Standard Feature ♦ Spectral filters for bias light, Optional ♦ Bias voltage up to ±3 V, Standard Feature ♦ Integrated I-V measurement, Optional ♦ Glovebox integration, Optional ♦ Automated test sequence, Optional ♦ Test fixtures, Optional ♦ Test device temperature control, Optional I-V Measurement Option♦ Fast setup♦ Integrated software PV Measurements saves you time and money with the I-V Measurement Option. This enables the system to perform I-V Measurements on small devices, without changing any electrical connections or remounting the sample. For measurements with approximated light intensities, the built-in bias light can be used as the light source. Higher accuracy measurements can be achieved using a separate solar simulator, available from PV Measurements. Maximum current is 200 mA. Measurement Automation♦ Quick scripting♦ Vary measurement conditions ♦ Explore device stability ♦ Dig deeper The optional QEXL automation interface allows you to create measurement scripts to handle measurements of multiple devices under various test conditions as a single click operation. The interface enables seamless integration with PV Measurements I-V Measurement Systems and Test Fixtures to save you time in the lab. Please inquire about integration with third party hardware. Convenient Beam Spot ♦ High spatial resolution ♦ Discern between edge effects and bulk effects ♦ Measure small samples with confidence Chromatic abberation free all-reflective optics ensure that the beam size you see at your alignment wavelength is the beam size at all wavelengths. The convergent beam and variable beam sizes allow you to measure your sample with the beam size of your choice. Crystalline silicon researchers can therefore discern between the characteristics of a cell without gridlines from the characteristics with gridlines included to help understand the amount of loss caused by the gridlines. Vacuum Test Fixtures♦ Fast sample mounts♦ Secure electrical contact ♦ Soft probe tips for delicate devices ♦ Sized for your device With our convenient test fixtures, you don’t have to worry about mounting your samples. The vacuum test fixtures shown below are designed for substrate devices with one or more contacts on the side that the light comes from. TFQ-5 vacuum test fixture for solar cell quantum efficiency measurements. ♦ Up to 5 cm cells ♦ Thermoelectric temperature (optional) ♦ Vacuum stage back contact TFQ-16 vacuum test fixture for solar cell quantum efficiency measurements. ♦ Up to 16 cm cells ♦ Thermoelectric temperature (optional) ♦ Vacuum stage back contact Multi-Channel Back-Contact Test Fixture ♦ Fast switching between devices ♦ Quick sample mount ♦ Highly repeatable contact ♦ Exand with Integrated Test Station Avoid the difficulty of probing small samples with this test fixture. The contact pins are always aligned to the device electrodes, and the sample channel is easily selectable through a software interface. Glovebox Integration ♦ Simple integration ♦ Controlled environment ♦ Fiber optic connection for maximum flexibility Measuring your samples inside the glovebox enables you to save time by characterizing the device performance without the need to encapsulate the sample. Please tell us about your research application so that we can configure a QE system to best meet your needs. |
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